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Response Compaction with any Number of Unknowns using a new LFSR Architecture - Technical Paper from DAC 2005



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Paper by Erik H. Volkerink, and Subhasish Mitra.

This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant response compactor (X-compact), and forces X’s that are not tolerated by X-Compact to known values. The data required to designate the X’s not tolerated by the X-compactor, also called mask data, is stored in a compressed format on the tester and decompressed onchip. We applied this technique to four industrial designs and obtained 26-fold to 60-fold reduction in test response data volume with no impact on test quality.

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